On-Wafer Noise Measurement at 300 GHz Using UTC-PD as Noise Source
نویسندگان
چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: IEEE Microwave and Wireless Components Letters
سال: 2014
ISSN: 1531-1309,1558-1764
DOI: 10.1109/lmwc.2014.2324762